Test point selection and fault diagnosis remain critical challenges in the analysis and maintenance of analog systems. As these systems operate with continuous-valued signals and are susceptible to ...

The exponential growth in design sizes has rendered the traditional methods of design-for-test, layout, and timing closure no longer sufficient. Design and test engineers not only have to constantly ...

Test points for hybrid ATPG/LBIST applications make it easier to reach the ISO 26262 standard of 90% stuck-at coverage for in-system test. The remarkable growth in automotive IC design has prompted a ...