Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

Process variations can transform the most innovative integrated circuit design into a failure. To account for these variations, designing for high manufacturing yield is as important as designing for ...

Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design optimization flow facilitates the application of design ...